A Data Structure for MOS Circuits

作者: Hao N. Nham , Chi-Yuan Lo , Ajoy K. Bose

DOI: 10.5555/800032.800734

关键词: Transistor faultFault (power engineering)Computer scienceData structureElectronic engineeringDelay calculationStuck-at faultElectronic circuit

摘要: This paper describes a data structure to represent the driver-load configurations in MOS circuits, which is used universally MOTIS simulation environment. In particular, mixed-mode evaluation including timing, and multiple/unit delay. Other applications include automatic delay calculation, transistor fault modeling, collapsing, simulation.

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