作者: Sang-Heon Han , Akhil Mauze , Elaheh Ahmadi , Tom Mates , Yuichi Oshima
关键词: Electron concentration 、 Morphology (linguistics) 、 Electron mobility 、 Doping 、 Range (particle radiation) 、 Materials science 、 Dopant 、 Molecular beam epitaxy 、 Plasma 、 Analytical chemistry
摘要: Ge and Sn as n-type dopants in (001) β-Ga 2 O 3 films were investigated using plasma-assisted molecular beam epitaxy. The Ge concentration showed a strong dependence on the …