Experimental investigation on field evaporation of singly and doubly charged rhodium

摘要: Abstract Field ion mass spectrometry and field appearance spectroscopy are used to analyze evaporation processes of singly doubly charged rhodium ions. strengths were ranged between 17 41 V/nm at tip temperatures 600 100 K. The energies species found increase with increasing from 29.5 ± 0.4 32.0 0.2 eV, those the 11.2 0.1 12.4 eV. Activation as determined measured temperature dependences counting rates equal for both kinds ionic decrease 1.5 0.05 eV strengths. observed cannot be predicted image hump model evaporation. Evaporation Rh1+is better understood using charge exchange model. Generation Rh2+ is described by postionization Rh1+ within frame a simple potential energy which average interaction surface atoms their nearest neighbours may derived.