作者: M.B El-Den , M.M El-Nahass
DOI: 10.1016/S0030-3992(03)00008-2
关键词: Lattice (order) 、 Dielectric 、 Absorption index 、 Tellurium 、 Refractive index 、 Materials science 、 Optics 、 Analytical chemistry 、 Optical energy 、 Chemical bond 、 Transmittance 、 Electrical and Electronic Engineering 、 Atomic and Molecular Physics, and Optics 、 Electronic, Optical and Magnetic Materials
摘要: Abstract Thin AsSe1.5−xTex films with 0⩽x (∼300 K ) . The optical constants, the refractive index, n, and absorption k, of were determined for investigated compositions different thickness values (100– 300 nm using spectrophotometric measurements transmittance, T, reflectance, R, at normal incidence in spectral range 400– 2500 obtained both n k found to be independent film within above mentioned range. estimated indirect direct energy gap decreased as tellurium content increased parent sample AsSe1.5. dispersion energy, Ed, lattice dielectric constant, eL, system have been correlated type amount chemical bonds relative proportion constituent elements examined compositions.