Organometallic precursors for seed/barrier processes and methods thereof

作者: Harsono Simka , John Plombon , Adrien Lavoie , Juan Dominguez , Joseph Han

DOI:

关键词: Substrate (chemistry)Physical vapor depositionDeposition (phase transition)ChemistryInorganic chemistryAtomic layer depositionChemical vapor depositionHybrid physical-chemical vapor deposition

摘要: Organometallic precursors and methods for deposition on a substrate in seed/barrier applications are herein disclosed. In some embodiments, the organometallic precursor is ruthenium-containing, tantalum-containing or combination thereof may be deposited by atomic layer deposition, chemical vapor and/or physical deposition.

参考文章(28)
Harsono Simka, Adrien Lavoie, Steven Johnston, Kevin O'Brien, Juan Dominguez, Organometallic precursors for the chemical phase deposition of metal films in interconnect applications ,(2005)
Hyungiun Kim, Stephen M. Rossnagel, ALD deposition of ruthenium ,(2003)
Florian Gstrein, Adrien R. Lavoie, Valery M. Dubin, Juan E. Dominguez, Carbon nanotube interconnect structures ,(2005)
Deborah Ann Neumayer, Stephen McConnell Gates, Atomic layer deposition with nitrate containing precursors ,(1999)
Christophe Marcadal, Seshadri Ganguli, Ling Chen, Wei Cao, Method of using a barrier sputter reactor to remove an underlying barrier layer ,(2000)
Hilke Donohue, Depositing a tantalum film ,(2002)
Alexander S. Borovik, Brian L. Benac, Chongying Xu, Ziyun Wang, Thomas H. Baum, Silicon source reagent compositions, and method of making and using same for microelectronic device structure ,(2000)
Nirmalya Maity, Rongjun Wang, Hua Chung, Atomic layer deposition of barrier materials ,(2004)