Diameter dependent growth rate and interfacial abruptness in vapor-liquid-solid Si/Si1-xGex heterostructure nanowires

作者: Trevor E. Clark , Pramod Nimmatoori , Kok-Keong Lew , Ling Pan , Joan M. Redwing

DOI: 10.1021/NL072849K

关键词: SilanesSilaneNanowireHeterojunctionThin filmNanotechnologyGermaneOptoelectronicsMaterials scienceVapor–liquid–solid methodSilicon

摘要: … application or removal of the GeH 4 . The hNWs … GeH 4 partial pressure of 24 mTorr. These partial pressures yield a gas-phase Ge molar fraction (Ge/(Si + Ge)) of 4 atom % during GeH …

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