作者: D. B. Armstrong
关键词: Fault indicator 、 Fault detection and isolation 、 Class (set theory) 、 Combinational logic 、 Stuck-at fault 、 Set (abstract data type) 、 NAND gate 、 Engineering 、 Net (mathematics) 、 Algorithm
摘要: A procedure is described for finding, by shortcut methods, a near-minimal set of tests detecting all single faults in combinational logic net. The should prove useful nets which are too large to be treated more exact methods [2]. so found also appears diagnosing (i.e., locating) faults. class considered that causes connections stuck at logical one or zero. may include AND, OR, NAND, NOR, and NOT gates. bases the ``path sensitizing'' concept, reduction net its ``equivalent normal form,'' abbreviated enf. It shown if can detects an appropriate subset enf, this will detect original enf provides vehicle systematically finding most desirable tests, namely those each many illustrated detail example.