On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets

作者: D. B. Armstrong

DOI: 10.1109/PGEC.1966.264376

关键词: Fault indicatorFault detection and isolationClass (set theory)Combinational logicStuck-at faultSet (abstract data type)NAND gateEngineeringNet (mathematics)Algorithm

摘要: A procedure is described for finding, by shortcut methods, a near-minimal set of tests detecting all single faults in combinational logic net. The should prove useful nets which are too large to be treated more exact methods [2]. so found also appears diagnosing (i.e., locating) faults. class considered that causes connections stuck at logical one or zero. may include AND, OR, NAND, NOR, and NOT gates. bases the ``path sensitizing'' concept, reduction net its ``equivalent normal form,'' abbreviated enf. It shown if can detects an appropriate subset enf, this will detect original enf provides vehicle systematically finding most desirable tests, namely those each many illustrated detail example.

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