An addition to the methods of test determination for fault detection in combinational circuits
作者： Ljubomir Cvetković
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摘要: We propose a procedure for determining fault detection tests single and multiple in combinational circuits. The stuck-at-fault model is used. By the proposed all test vectors circuit are determined. path sensitization method used signal propagation while signals defined on four element set. can also be applied to programmable logic devices. consider two-level circuits which realized by PAL architecture we set detects stuck-at-faults. As mathematical tool, cube theory
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