Probing system for integrated circuit devices
作者： Chih Tsun Huang , Cheng Wen Wu , Yu Tsao Hsing
DOI:
关键词: Engineering 、 Radio frequency signal 、 Voltage regulator 、 Pin compatibility 、 Electrical engineering 、 Integrated circuit 、 Power (physics) 、 Automatic test equipment 、 Clock generator 、 Controller (computing)
摘要: The present invention discloses a probing system for integrated circuit devices, which transmits testing data between an automatic test equipment (ATE) and device. ATE includes first transceiving module, the device core circuit, built-in self-test (BIST) electrically connected to controller configured control operation of BIST second module exchange with module. Preferably, further clock generator power regulator wherein radio frequency signal via receives drive generate initiate circuit.
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