System and method for wirelessly testing integrated circuits

作者: Marie-Lise Flottes , David Andreu , Ziad Noun , Serge Bernard , Philippe Cauvet

DOI:

关键词: Automatic test equipmentEmbedded systemWirelessEngineeringIntegrated circuitMedia access controlComputer hardwareWi-Fi arrayProtocol (object-oriented programming)Block (telecommunications)Interface (computing)

摘要: A system and method for wirelessly testing integrated circuits provides a multiple layer interface to test circuits. wireless structure an circuit comprises transceiver interface. The is configured receive information from tester transmit result the tester. between circuit. media access controller control block. implement protocol communication. block decode received tester, trigger of in response decoded information, encode that generated by test.

参考文章(15)
Sandip Kundu, Rajeshwar Galivanche, Tak Mak, Testing integrated circuits using high bandwidth wireless technology ,(2004)
Steven Harold Slupsky, Non-contact tester for electronic circuits ,(2003)
William D. Nicholson, Thomas M. Fudali, Wireless communication for diagnostic instrument ,(2003)
Igor Khandros, Charles Miller, A. Sporck, Benjamin Eldridge, Wireless test system ,(2007)
Te-Wen Ko, Yu-Tsao Hsing, Cheng-Wen Wu, Chih-Tsun Huang, Stable Performance MAC Protocol for HOY Wireless Tester under Large Population international symposium on vlsi design, automation and test. pp. 1- 4 ,(2007) , 10.1109/VDAT.2007.373235
Chih Tsun Huang, Cheng Wen Wu, Yu Tsao Hsing, Probing system for integrated circuit devices ,(2008)
Cheng-Wen Wu, Chih-Tsun Huang, Shi-Yu Huang, Po-Chiun Huang, Tsin-Yuan Chang, Yu-Tsao Hsing, The HOY Tester-Can IC Testing Go Wireless? international symposium on vlsi design, automation and test. pp. 1- 4 ,(2006) , 10.1109/VDAT.2006.258155
De Gyvez Jose De Jesus Pineda, Noman Hai, Raf L. J. Roovers, Alexander G. Gronthoud, Testable electronic device for wireless communication ,(2008)
Romain Desplats, Philippe Perdu, Method for customizing an integrated circuit element ,(2001)