The HOY Tester-Can IC Testing Go Wireless?
作者： Cheng-Wen Wu , Chih-Tsun Huang , Shi-Yu Huang , Po-Chiun Huang , Tsin-Yuan Chang
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摘要: … and the test systems and applications it defines. Our vision is that in ten years, IC Test cost is … testing can go wireless in at least some high-end applications. cost structure in advanced …
sci-hub.se 参考文章(12)
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