Chemistry-dependent X-ray-induced surface charging

摘要: Materials science in general, and surface/interface particular, have greatly benefited from the development of high energy synchrotron radiation facilities. Irradiation with intense ionizing beams can however influence relevant sample properties. Permanent damage irradiation-induced modifications been investigated detail during last decades. Conversely, reversible alterations taking place only irradiation are still lacking comprehensive situ characterization. Irradiation-induced surface charging phenomena particularly for a wide range interface investigations, particular those involving surfaces solid substrates contact gaseous or liquid phases. Here, we demonstrate partially radiation-induced phenomena, which extend far beyond spatial dimensions X-ray beam mainly as consequence interaction between ionized ambient molecules. The magnitude sign found to be chemistry specific dependent on substrates' bulk conductivity grounding conditions. These results obtained by combining scanning Kelvin probe diffractometer allow simultaneous work function measurements precisely controlled hard micro-beam irradiation.