Electron-beam damaged high-temperature superconductor Josephson junctions
作者： A. J. Pauza , W. E. Booij , K. Herrmann , D. F. Moore , M. G. Blamire
DOI: 10.1063/1.366422
关键词: Josephson effect 、 Electron 、 Condensed matter physics 、 Beam (structure) 、 High-temperature superconductivity 、 Materials science 、 Current density 、 Superconductivity 、 Operating temperature 、 Thin film
摘要: Results are presented on the fabrication and characterization of high critical temperature Josephson junctions in thin films YBa2Cu3O7−δ produced by process focused electron-beam irradiation using 350 keV electrons. The so have uniform spatial current densities, can be described terms resistive shunted junction model, their densities tailored for a given operating temperature. physical properties damaged barrier as superconducting material either reduced or zero (Tc), which has length ∼15 nm. Tc reduction is caused primarily oxygen Frenkel defects Cu–O planes. large beam currents used mean that extent limited incident diameter, rather than scattering within film. calculated superconductor/normal/superconductor (SNS) model with no bound...
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