XRD, SEM, AFM, HRTEM, EDAX and RBS studies of chemically deposited Sb2S3 and Sb2Se3 thin films
作者： CD Lokhande , BR Sankapal , RS Mane , HM Pathan , M Muller
DOI: 10.1016/S0169-4332(01)00819-4
关键词: High-resolution transmission electron microscopy 、 Nanocrystalline material 、 Scanning electron microscope 、 Transmission electron microscopy 、 Microstructure 、 Thin film 、 Analytical chemistry 、 Chemical bath deposition 、 Orthorhombic crystal system 、 Chemistry
摘要: Abstract Nanocrystalline thin films of Sb2S3 and Sb2Se3 are obtained at low temperature by simple chemical deposition method. The preparative parameters optimized to get nanocrystalline films. characterized for structural, surface morphological compositional analyses means X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force (AFM), high-resolution transmission micrograph (HRTEM), energy-dispersive (EDAX) Rutherford back-scattering (RBS). XRD study confirms orthorhombic structure Sb2Se3. Nanocrystallinity is evidenced from SEM, AFM HRTEM studies with some random distribution nanocrystallites. Stoichiometry studied EDAX RBS which showed inclusion oxygen in the unavoidable chemically deposited chalcogenides
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