作者: Chris M. Schreiber , Haim Feigenbaum
DOI:
关键词: Stress (mechanics) 、 Electrical engineering 、 Electrical connection 、 Integrated circuit 、 Reliability (semiconductor) 、 Engineering
摘要: A method for attaching an integrated circuit to a flexible which includes the acts of providing having plurality contact pads formed upon surface thereof; possessing bumps integral area; and by fusing at least some circuit. The have shape mitigates local stress buildup within after attachment pads, so as enhance reliability electrical connection.