作者: Tao Zhang , Jun Chen
DOI: 10.1007/S00339-020-04009-Z
关键词: Photodetector 、 van der Waals force 、 Indium phosphide 、 Condensed matter physics 、 Graphene 、 Schottky barrier 、 Responsivity 、 Photoelectric effect 、 Passivation 、 Materials science
摘要: Graphene and P-type indium phosphide (P-InP) could be combined by van der Waals forces to form a Schottky junction, which can applied in photodetection. This study reported graphene/P-InP junction near-infrared photodetector with 3-nm-thick $${\text{Al}}_{2} {\text{O}}_{3}$$ passivation layer investigated the photoelectric characteristics of such device. As result, had barrier 0.89 eV. Besides, this device significant response wavelength 808 nm light responsivity detectivity up 5.2 mA/W $$1.3 \times 10^{10} \;{\text{cm Hz}}^{1/2} \;{\text{W}}^{ - 1}$$ , respectively, under reverse bias voltage 0.4 V. It is expected that Graphene/P-InP an may play vital role field optoelectronic devices future.