The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors
作者： H.W. Zandbergen , R. Bokel , E. Connolly , J. Jansen
DOI: 10.1016/S0968-4328(99)00042-6
关键词: Electron microscope 、 Atomic physics 、 Focus (optics) 、 Phase (waves) 、 Superconductivity 、 Electron diffraction 、 Optics 、 Structure (category theory) 、 Crystal 、 Amplitude 、 Chemistry
摘要: Abstract The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that combination amplitude phase information waves at various thicknesses allows one to determine positions all atoms. Whereas light atoms can be best distinguished in image a somewhat thicker part crystal, heavy observed reliably part. In particular change with thickness was found very useful determination presence
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