作者: J.-G. Kim , K. Song , K. Kwon , K. Hong , Y.-J. Kim
关键词:
摘要: We performed structure analysis of Si single crystal and CaMoO(4) inorganic by energy-filtered precession electron diffraction (PED). Structure was using conventional selected area diffraction, PED (EF-PED). The EF-PED method proved to be advantageous in determining the structures accurate cell parameters crystals due resolution enhancement sharpening peak shapes reducing inelastic scattering. Among methods, zero-loss most useful for minimizing scattering intensities, while plasmon-loss could used effectively determine symmetry closely observing conditions forbidden reflections.