Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy

作者： Rajeev R. Kosireddy , Stephen T. Schaefer , Arvind J. Shalindar , Preston T. Webster , Shane R. Johnson

关键词: Materials science 、 Cross section (physics) 、 Optics 、 Quality (physics) 、 Transmission electron microscopy

摘要:

参考文章(1)

Preston T. Webster, Arvind J. Shalindar, Stephen T. Schaefer, Shane R. Johnson, Bandgap and composition of bulk InAsSbBi grown by molecular beam epitaxy Applied Physics Letters. ,vol. 111, pp. 082104- ,(2017) , 10.1063/1.4994847