Microprocessor performance improvement by dynamic nbti compensation through transistor forward biasing

作者: Georgios K. Konstadinidis

DOI:

关键词: TransistorBiasingSemiconductor deviceNegative-bias temperature instabilityCompensation (engineering)Lookup tableElectronic engineeringEngineeringElectrical engineeringMicroprocessorThreshold voltage

摘要: A method for compensating negative bias temperature instability (NBTI) effects on a given model of transistors includes monitoring the NBTI over time, determining change in threshold voltage time based monitoring, forward voltage, and applying to time. The may further include storing results lookup table, adjusting table. emulating system comprising plurality semiconductor devices which are used.

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