Apparatus and method for optical interrogation
作者： Giovanni Barbarossa , Yan Zhou
DOI:
关键词: Interrogation 、 Beam (structure) 、 Optics 、 Materials science 、 Reference sample 、 Shear (sheet metal)
摘要: An interrogation apparatus and method use a partial shear optical interference to interrogate the properties of an array target specimen probe volumes as compared reference sample volumes. The produces formatted beam that contains partially sheared pair is into completely pairs. Target are suitably organized exposed
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