Fringe fields in nonlinear photoemission microscopy

作者: L. I. Chelaru , M. Horn-von Hoegen , D. Thien , F.-J. Meyer zu Heringdorf

DOI: 10.1103/PHYSREVB.73.115416

关键词: OpticsCondensed matter physicsNonlinear systemPhotoemission microscopyInverse photoemission spectroscopyQuasiparticleAngle-resolved photoemission spectroscopyMaterials science

摘要:

参考文章(19)
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