作者: Jeongmin Seo , Won Seok Chang , Taek-Soo Kim
DOI: 10.1016/J.TSF.2015.01.007
关键词: X-ray photoelectron spectroscopy 、 Graphene 、 Substrate (chemistry) 、 Materials science 、 Adhesion 、 Chemical engineering 、 Chemical modification 、 Ozone 、 Inorganic chemistry 、 Copper 、 Photoemission spectroscopy
摘要: Abstract The weak adhesion between graphene and its substrate is a potentially significant problem for graphene-based electronic devices. However, quantitative studies on improvement using simple surface treatments have not yet been reported. In this study, we report the of graphene/copper interface UV/ozone treatment. energy measured directly double cantilever beam fracture mechanics testing. A significantly improved 2.10 ± 0.27 J/m2 achieved with 15 min treatment; approximately 200% that without chemical modification also characterized X-ray photoemission spectroscopy (XPS).