作者: M. Frommert , C. Zobrist , L. Lahn , A. Böttcher , D. Raabe
DOI: 10.1016/J.JMMM.2008.04.102
关键词: X-ray crystallography 、 Microscopy 、 Composite material 、 Recrystallization (metallurgy) 、 Texture measurement 、 Diffraction 、 Electron backscatter diffraction 、 Grain size 、 Materials science 、 Electronic, Optical and Magnetic Materials 、 Condensed matter physics
摘要: The measurement of the final Goss texture sharpness in grain-oriented electrical steels is a challenging task due to the immense variations is grain size ranging from millimeters to …