Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite
作者： Eugenia Zelaya , Dominique Schryvers
DOI: 10.1002/JEMT.20877
关键词: Electropolishing 、 Precipitation (chemistry) 、 Analytical chemistry 、 Crystallography 、 Austenite 、 Ion 、 Focused ion beam 、 Ion milling machine 、 Irradiation 、 Materials science 、 Sample preparation
摘要: The irradiation effects of thinning a sample Cu-Zn-Al shape memory alloy to electron transparency by Ga 1 focused ion beam were investigated. This method was compared with conventional electropolishing and Ar milling. No implanted detected but surface FCC precipitation found as result the preparation. Decreasing dose lowering energy current ions did not lead complete disappearance structure. latter could only be removed after gentle milling sample. It further concluded that precipi- tation is independent crystallographic orientation surface. Microsc. Res. Tech. 74:84-91, 2011. V 2010 Wiley-Liss, Inc.
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