Future challenges of flash memory technologies
作者： Chih-Yuan Lu , Kuang-Yeu Hsieh , Rich Liu
DOI: 10.1016/J.MEE.2008.08.007
关键词: Node (circuits) 、 NAND gate 、 Charge trap flash 、 Computer science 、 Integrated circuit 、 Electrical engineering 、 Flash (photography) 、 High-κ dielectric 、 Logic level 、 Flash memory
摘要: … flash demands to new heights with no visible application limits in view. Despite the rapid growth, both NOR and NAND flash memories face steep technology challenges … the challenges …
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