Study of single-electron excitations by electron microscopy II. Cathodoluminescence image contrast from localized energy transfers
作者： S. J. Pennycook , A. Howie
DOI: 10.1080/01418618008243890
关键词: Energy filtered transmission electron microscopy 、 Reflection high-energy electron diffraction 、 Cathodoluminescence 、 High-resolution transmission electron microscopy 、 Scanning electron microscope 、 Scanning confocal electron microscopy 、 Electron tomography 、 Chemistry 、 Scanning transmission electron microscopy 、 Atomic physics
摘要: Abstract Observations of cathodoluminescence in ZnS single crystals using scanning transmission electron microscopy exhibit a dependence on crystal orientation indicating that about 20% the signal originates localized excitations. This figure can be explained terms energy transfer to valence excitations from energetic secondary electrons ejected inner shells. Similar effects may operate electron-beam-induced-conductivity images, X-ray production and other processes.
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