Micro-Diagnostics: X-ray and Synchrotron Techniques

摘要: Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary and synchrotron higher resolution microdiagnostics take advantage scattering effects. In contrast to directly imaging methods their is only limited by diffraction limit wavelength, far below atomic dimensions. These scanning topography refraction tomography may permit systematic diagnostics finding exploiting structure/property relations like correlations among atomic, nano microstructures with macroscopic properties. Their basic over microscopic potential non-destructive characterisation materials, from invasive sample treatments. They combine spatial resolution.