作者: C.H Lei , C.L Jia , M Siegert , J Schubert , Ch Buchal
DOI: 10.1016/S0022-0248(99)00158-X
关键词: Materials science 、 Mineralogy 、 Yttria-stabilized zirconia 、 Epitaxy 、 Transmission electron microscopy 、 Microstructure 、 Thin film 、 Lattice (order) 、 Laser ablation 、 Ceramic 、 Composite material
摘要: Abstract The microstructure and crystallographic relations in BaTiO 3 /MgO/YSZ multilayer films deposited on Si(0 0 1) substrate are investigated by means of transmission electron microscopy. On the YSZ layer grows epitaxially with a cubic-to-cubic orientation relationship. MgO is columnar-grained exhibits common {1 1 1} plane grains parallel to film surface. in-plane orientations these lead general relationship respect layer: 〈1 1 2 〉 ‖〈1 0 0〉 , 〈 ‖〈0 . With relationship, shows same grain morphology as layer. These between different layers discussed considering lattice match atomic environments across interfaces.