Structured light illumination for extended resolution in fluorescence microscopy
作者： R. Fedosseev , Y. Belyaev , J. Frohn , A. Stemmer
DOI: 10.1016/J.OPTLASENG.2004.04.008
关键词: Critical illumination 、 Resolution (electron density) 、 Microscope 、 Köhler illumination 、 Bright-field microscopy 、 Light sheet fluorescence microscopy 、 Materials science 、 Structured light 、 Microscopy 、 Optics
摘要: … The problem of extending resolution in optical microscopy … techniques with resolution extension over the classical limit take … light, which exceeds the resolution of standard confocal …
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