作者: Thomas R. Omstead , Panya Wongsenakhum , Edward J. Nagy , William Starks , William J. Messner
DOI:
关键词: Engineering drawing 、 Deposition (phase transition) 、 Completion (oil and gas wells) 、 Conductance 、 Substrate (printing) 、 Materials science 、 Flow (psychology) 、 Process (computing) 、 Optoelectronics 、 Purge 、 Chemical vapor deposition
摘要: A method and system for fabricating a device on substrate with process gas, such as chemical vapor deposition. reaction chamber support chuck cooperate to form low conductance configuration axisymetric gas flow over the high enhanced evacuation of residual from upon completion process. dual has an indented region that aligns exhaust port restrict in configuration, moves distal showerhead provide reduced restriction evacuation. The includes thermal control enhancing film deposition reducing chuck. An opening housing provides independent housing. present invention enhance throughput formation by purge cycle times.