Characterization of active and passive optical properties of an optical device
作者： Gregory D. Vanwiggeren , Douglas M. Baney
DOI:
关键词: Device under test 、 Local oscillator signal 、 Engineering 、 Optoelectronics 、 Spectrum analyzer 、 Characterization (materials science) 、 Interferometry 、 Electronic engineering 、 Local oscillator
摘要: Characterizing active and passive properties of an optical device involves applying a local oscillator signal to under test (DUT) providing portion the (referred as reference signal) directly analyzer. Providing analyzer enables interferometric measurements associated with DUT be obtained along direct measurements, where result from combining that is applied signal. The are used characterize while DUT.
lens.org 参考文章(8)
Suhaila N. White, Ian S. Trowbridge, Raymond Taetle, Enhanced inhibition of tumor cell proliferation using a combination of two monoclonal antibodies to the human transferrin receptor ,(1991)
Gregory D VanWiggeren, Ali R Motamedi, DM Barley, None, Single-scan interferometric component analyzer IEEE Photonics Technology Letters. ,vol. 15, pp. 263- 265 ,(2003) , 10.1109/LPT.2002.806100
G.D. VanWiggeren, D.M. Baney, Swept-wavelength interferometric analysis of multiport components IEEE Photonics Technology Letters. ,vol. 15, pp. 1267- 1269 ,(2003) , 10.1109/LPT.2003.816663
Tohru Mori, Masaru Fukushima, Optical amplifier evaluation method and optical amplifier evaluation instrument ,(2001)
Hiroji Masuda, Kazuo Aida, Kiyoshi Nakagawa, Method and apparatus for monitoring noise figure of optical amplifier ,(1993)
Harald Rosenfeldt, Method and apparatus for determining the polarisation mode dispersion of an optical device ,(2000)
Peng Li, Jan Brian Wilstrup, Electromagnetic and optical analyzer ,(2001)
Tohru Mori, Kazuo Aida, Method and device for measuring a noise figure in optical amplifiers ,(1996)