PUCE OPTOELECTRONIQUE ET PROCEDE DE TEST DE CIRCUITS PHOTONIQUES D'UNE TELLE PUCE

作者: Le Maitre Patrick , Carpentier Jean-Francois

DOI:

关键词:

摘要: L'invention concerne une puce optoelectronique (5) comprenant un couple d'entrees optiques (ETE1, ayant meme bande passante et dont chacune est adaptee a polarisation differente, au moins circuit photonique tester (DUT1), dispositif de couplage optique (1) configure pour relier les deux entrees tester.

参考文章(7)
Frank Peters, Fred Kish, Charles Joyner, Radhakrishnan Nagarajan, Mehrdad Ziari, Mark Missey, Insertion loss reduction, passivation and/or planarization and in-wafer testing of integrated optical components in photonic integrated circuits (PICs) ,(2003)
Frank Peters, Fred Kish, Ting-Kuang Chiang, Atul Mathur, Vincent Dominic, Charles Joyner, Radhakrishnan Nagarajan, David Welch, Richard Schneider, Mark Missey, Optical signal receiver photonic integrated circuit (RxPIC), an associated optical signal transmitter photonic integrated circuit (TxPIC) and an optical network transmission system utilizing these circuits ,(2002)
Ronald N. Parente, David F. Botros, Paul Boyd, Peter K. Lison, Method and apparatus for improved testing of optical circuit modules ,(2002)
Carpentier Jean-Francois, Le Maitre Patrick, Grosse Philippe, Opto electrical test measurement system for integrated photonic devices and circuits ,(2017)