Near-field scanning optical microscope with a metallic probe tip.
作者： Yasushi Inouye , Satoshi Kawata
DOI: 10.1364/OL.19.000159
关键词: Scanning Hall probe microscope 、 Scanning probe microscopy 、 Scanning capacitance microscopy 、 Near-field scanning optical microscope 、 Optics 、 Light intensity 、 Physics 、 Microscope 、 Near-field optics 、 Feature-oriented scanning
摘要: A near-field scanning optical microscope with a metallic probe tip was developed for detecting localized photons near the surface of the fine structure of a sample. In this microscope a …
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harvard.edu参考文章(7)
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