Photoelectric encoder and method of manufacturing scales

作者: Takashi Kanno , Kenichi Kojima , Atsushi Tominaga

DOI:

关键词: Engineering drawingEtchingMetalResistMaterials scienceTungstenSubstrate (electronics)Layer (electronics)Diffraction gratingOptoelectronicsChromium

摘要: A first metal layer of tungsten is formed on a substrate in scale. second chromium the layer. The selectively removed with mask resist and an etching stopper to form optical grating.

参考文章(11)
Wolfgang Holzapfel, Elmar Josef Mayer, Scanning unit for an optical position measuring device ,(2001)
Atsushi Tajiri, Koutarou Furusawa, Mitsuaki Matsumoto, Koji Tominaga, Kazushi Mori, Element having microstructure and manufacturing method thereof ,(2006)
Andreas Franz, Michael Allgauer, Georg Flatscher, Erich Bayer, Peter Speckbacher, Erwin Spanner, Phase grating and method of producing phase grating ,(1996)
Sekine Kumajirou, Nakada Katsuki, Hashimoto Shinsuke, FORMATION OF OPTICAL DIFFRACTION GRATING CORE FOR INJECTION MOLDING ,(1990)
Anton Sailer, Michael Allgäuer, Peter Speckbacher, Walburga Kern, Georg Flatscher, Photoelectric position measuring device ,(1997)