18)O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid
作者： A. Baron-Wiecheć , J. J. Ganem , S. J. Garcia-Vergara , P. Skeldon , G. E. Thompson
DOI: 10.1149/1.3490640
关键词: Electrochemistry 、 Barrier layer 、 Anodizing 、 Porosity 、 Metallurgy 、 Materials science 、 Oxide 、 Substrate (electronics) 、 Chemical engineering 、 Electrolyte 、 Phosphoric acid
摘要: (18)O tracer is used to investigate the development of porous anodic films at constant current in phosphoric acid on electropolished aluminum. A barrier layer and region form initially with pore size related surface texture substrate. Subsequently, major pores emerge, their sizes anodizing voltage. The evolution film accompanied by increases growth rate formation efficiency. ions a preformed oxide are retained during anodization nonenriched electrolyte, being partitioned among (i) texture-dependent porosity, (ii) walls pores, and, diminishing amounts, (iii) inner layer. (c) 2010 Electrochemical Society. [DOI: 10.1149/1.3490640] All rights reserved.
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ecsdl.org参考文章(60)
L. F. Lin, C. Y. Chao, D. D. Macdonald, A Point Defect Model for Anodic Passive Films: II . Chemical Breakdown and Pit Initiation Journal of The Electrochemical Society. ,vol. 128, pp. 1194- 1198 ,(1981) , 10.1149/1.2127592
P.G. Sheasby, R. Pinner, S. Wernick, Surface treatment and finishing of aluminum and its alloys. Volumes 1 and 2 (5th revised and enlarged edition) OH/Teddington, England, ASM International/Finishing Publications, Ltd.,Metals Park, OH. ,(1987)
Georges. Amsel, David. Samuel, Microanalysis of the stable isotopes of oxygen by means of nuclear reactions Analytical Chemistry. ,vol. 39, pp. 1689- 1698 ,(1967) , 10.1021/AC50157A027
K. Shimizu, G.E. Thompson, G.C. Wood, Y. Xu, Direct observations of ion-implanted xenon marker layers in anodic barrier films on aluminium Thin Solid Films. ,vol. 88, pp. 255- 262 ,(1982) , 10.1016/0040-6090(82)90054-2
A. C. Harkness, L. Young, HIGH RESISTANCE ANODIC OXIDE FILMS ON ALUMINIUM Canadian Journal of Chemistry. ,vol. 44, pp. 2409- 2413 ,(1966) , 10.1139/V66-363
F. Brown, W. D. Mackintosh, The Use of Rutherford Backscattering to Study the Behavior of Ion‐Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l Journal of The Electrochemical Society. ,vol. 120, pp. 1096- 1102 ,(1973) , 10.1149/1.2403637
P. Skeldon, K. Shimizu, G. E. Thompson, G. C. Wood, Barrier‐Type anodic films on aluminium in aqueous borate solutions: 1—Film density and stopping power of anodic alumina films for alpha particles Surface and Interface Analysis. ,vol. 5, pp. 247- 251 ,(1983) , 10.1002/SIA.740050605
Sachiko Ono, Hideki Ichinose, Noboru Masuko, The high resolution observation of porous anodic films formed on aluminum in phosphoric acid solution Corrosion Science. ,vol. 33, pp. 841- 850 ,(1992) , 10.1016/0010-938X(92)90048-8
A.A. Alibhai, R.J. Chater, D.S. McPhail, B.A. Shollock, Use of isotopic tracers and SIMS analysis for evaluating the oxidation behaviour of protective coatings on nickel based superalloys Applied Surface Science. ,vol. 203, pp. 630- 633 ,(2003) , 10.1016/S0169-4332(02)00780-8
James F. Ziegler, M.D. Ziegler, J.P. Biersack, SRIM – The stopping and range of ions in matter (2010) Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms. ,vol. 268, pp. 1818- 1823 ,(2010) , 10.1016/J.NIMB.2010.02.091