Adsorption, detection and identification of components of ambient air with desorption/ionization on silicon mass spectrometry (DIOS-MS)
作者： Chris Lee Stumpf , Jeffrey W Finch , Bruce J Compton
DOI:
关键词: Matrix-assisted laser desorption electrospray ionization 、 Desorption/ionization on silicon 、 Ambient ionization 、 Soft laser desorption 、 Atmospheric-pressure laser ionization 、 Analytical chemistry 、 Mass spectrometry 、 Chemistry 、 Ion source 、 Desorption electrospray ionization
摘要: The present invention provides a device, system, and associated methods to actively or passively sample air by directing it onto the surface of porous light-absorbing semiconductor, for example, desorption/ionization on silicon (“DIOS”) chip. Upon adsorption an analyte, may be analyzed directly laser time-of-flight mass spectrometry. Because process subsequent detection does not require elevated temperatures, thermal degradation analytes is avoided.
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