Surface melting of neon and argon films: Profile of the crystal-melt interface
作者： Da-Ming Zhu , J. G. Dash
DOI: 10.1103/PHYSREVLETT.60.432
关键词: Thermodynamics 、 Exponential decay 、 Materials science 、 Fusion 、 Argon 、 Molecular physics 、 Thin film 、 Neon
摘要: Surface melting in Ne films evolves with thickness from logarithmic to power-law temperature dependence. The thin-film behavior appears be due the expected exponential decay of solid order. variation entropy is examined determine profile crystal-melt interface. interface width approximately 6 layers and 4 Ar.
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