作者: Masayuki Iida , Takanori Shimizu , Hiroyuki Enomoto , Hajime Ozaki
DOI: 10.1143/JJAP.32.4449
关键词: Photoemission spectroscopy 、 Electronic structure 、 X-ray photoelectron spectroscopy 、 Nuclear magnetic resonance 、 Band gap 、 Electrical resistivity and conductivity 、 Chemistry 、 Epitaxy 、 Electron 、 Lattice constant 、 Condensed matter physics 、 General Engineering 、 General Physics and Astronomy
摘要: P- and n-type Pb1-xEuxTe (0≤x≤0.25) single-crystal films were prepared on BaF2 (111) substrates using the hot-wall epitaxy technique. The lattice constant increases nonlinearly with composition ratio x, energy gap rapidly up to x=0.07, while its rate of increase decelerates for x>0.07. X-ray photoelectron spectroscopy measurements revealed that localized Eu 4f level centers around 1.2-1.5 eV below valence band maximum. It is seen from transport all are metallic but p-type a metal-to-insulator transition takes place at x=0.07. Using these results, electronic structure proposed in which electron plays an important role properties intermediate (x>0.07).