作者: Reuben J. Yeo , Ehsan Rismani , Neeraj Dwivedi , Daniel J. Blackwood , H.R. Tan
DOI: 10.1016/J.DIAMOND.2014.02.011
关键词: Surface modification 、 Raman spectroscopy 、 Analytical chemistry 、 Transmission electron microscopy 、 Materials science 、 Carbon 、 Substrate (electronics) 、 Corrosion 、 Vacuum arc 、 X-ray photoelectron spectroscopy
摘要: Abstract The corrosion performance of commercial hard disk media which was subjected to bi-level surface modification has been reported. treatment carried out by bombarding the magnetic with C+ ions at 350 eV followed 90 eV using filtered cathodic vacuum arc (FCVA). energy and embedment depth impinging were adjusted applying an optimized bias substrate simulated a Stopping Range Ions in Matter (SRIM) code predicted formation graded atomically mixed layer carbon-media interface. Cross-section transmission electron microscopy (TEM) revealed 1.8 nm dense nano-layered carbon overcoat structure on media. Despite ~ 33% reduction thickness, modified showed similar that commercially manufactured thicker 2.7 nm. This improvement corrosion/oxidation resistance per unit thickness can be attributed highly sp3 bonded layer, as X-ray photoelectron spectroscopy (XPS) Raman spectroscopy. study demonstrates effectiveness technique forming ultra-thin yet protective for future disks high areal densities.