Extraction of parasitic circuit elements in a PEBB for application in the virtual test bed

作者: B. Beker , J.L. Hudgins , J. Coronati , B. Gillett , S. Shekhawat

DOI: 10.1109/IAS.1997.629015

关键词: SolverInductanceParasitic capacitanceParasitic elementVirtual prototypingEngineeringElectronic engineeringCapacitancePower electronicsElectrical element

摘要: A numerical procedure for extracting parasitic circuit elements using a quasi-static field solver, as part of the virtual test bed (VTB), is discussed. The inductance and capacitance values obtained from model are compared to measured low-inductance power electronic building block (PEBB) module, designed constructed at Harris Semiconductor.

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