Electrical properties and Raman study of In-doped effects in CdTe

作者: Theodore Ganetsos , Eduard Belas , Bill Kotsos

DOI: 10.1016/J.PROENG.2011.12.087

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摘要: Abstract Cadmium-telluride (CdTe) first became known as an infrared optical material one of the hot pressed polycrystalline Kodak materials. It is a very difficult to grow from melt because both elements are volatile and it has high melting point where appreciable vapour pressure can exist for even if stoichiometry near perfect. congruent 1097 °C, which means below that temperature Cd-rich liquids Te-rich in equilibrium with pure CdTe. [1]High resistivity In-doped CdTe most important materials preparation room X- ray gamma detectors. well CdTeIn strongly depends on In doping concentration growth post-annealing conditions [2,3]. this research work we studied after annealing at various temperatures using Raman spectroscopy.[4–6]

参考文章(5)
D. Drews, J. Sahm, W. Richter, D. R. T. Zahn, Molecular‐beam‐epitaxy growth of CdTe on InSb (110) monitored in situ by Raman spectroscopy Journal of Applied Physics. ,vol. 78, pp. 4060- 4065 ,(1995) , 10.1063/1.359862
M. Ramsteiner, A. Lusson, J. Wagner, P. Koidl, M. Bruder, Implantation effects on resonant Raman scattering in CdTe and Cd0.23Hg0.77Te Journal of Crystal Growth. ,vol. 101, pp. 420- 424 ,(1990) , 10.1016/0022-0248(90)91006-C
E. Belas, R. Grill, J. Franc, L. Turjanska, I. Turkevych, P. Moravec, P. Höschl, Electrical properties of CdTe near the melting point Journal of Electronic Materials. ,vol. 32, pp. 752- 755 ,(2003) , 10.1007/S11664-003-0065-7
E. Belas, R. Grill, A.L. Toth, P. Moravec, P. Horodysky, J. Franc, P. Hoschl, H. Wolf, T. Wichert, Electrical and optical properties of in-doped CdTe after Cd-rich annealing IEEE Transactions on Nuclear Science. ,vol. 52, pp. 1932- 1936 ,(2005) , 10.1109/TNS.2005.856874
D. Mangalaraj, M. G. Sridharan, H. Chul Lee, Sa. K. Narayandass, Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films Journal of Optoelectronics and Advanced Materials. ,vol. 7, pp. 1483- 1491 ,(2005)