Protecting chip settings using secured scan chains
作者： Benedikt Geukes , Bodo Hoppe , Matteo Michel , Juergen Wakunda
DOI:
关键词:
摘要: Some embodiments include a method for processing scan chain in an integrated circuit. The can include: receiving, the circuit, chain, wherein includes secret key pattern; separating pattern from chain; comparing to reference determining, based on pattern, that does not match and generating signal indicating pattern.
lens.org 参考文章(20)
Mark B. Roberts, Scott K. Roberts, Method and apparatus for generating a boundary scan description and model ,(2005)
Benedikt Geukes, Matteo Michel, Carsten Schmitt, Manfred H. Walz, Verifying and detecting boundary scan cells to input/output mapping ,(2011)
Peter J. Vigil, Louis S. Lederer, James S. Blomgren, Self-testing multi-processor die with internal compare points ,(1996)
Benoit Nadeau-Dostie, Jean-Francois Cote, Scan test method providing real time identification of failing test patterns and test controller for use therewith ,(2003)
Pushpasheel Tawade, Rosa M. Y. Chow, Neil G. Jacobson, Sanjay Srivastava, Bin Dai, Emigdio M. Flores, Sungnien Jerry Mao, Identification of multi-device systems ,(2004)
Xiaoqing Wen, Laung-Terng (L.-T.) Wang, Method and apparatus for unifying self-test with scan-test during prototype debug and production test ,(2003)
Sumit Dasgupta, Prabhakar Goel, Thomas W. Williams, Level sensitive scan design (LSSD) system ,(1979)
Sean Patrick Griffin, Brent W. Bossi, Computerized system and method for rendering reports in a healthcare environment ,(2005)
J. Lee, M. Tehranipoor, C. Patel, J. Plusquellic, Securing Scan Design Using Lock and Key Technique defect and fault tolerance in vlsi and nanotechnology systems. pp. 51- 62 ,(2005) , 10.1109/DFTVS.2005.58
D. Mukhopadhyay, S. Banerjee, D. RoyChowdhury, B.B. Bhattacharya, CryptoScan: A Secured Scan Chain Architecture asian test symposium. pp. 348- 353 ,(2005) , 10.1109/ATS.2005.42