Uniaxial stress component in diamond anvil high‐pressure x‐ray cameras
作者： A. K. Singh , C. Balasingh
DOI: 10.1063/1.323568
关键词:
摘要: The effect of the uniaxial stress component on lattice strains measured with a diamond anvil x‐ray apparatus has been discussed. results are compared those published earlier for tungsten carbide apparatus.
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