Mapping of Si/SiC p-n heterojunctions using scanning internal photoemission microscopy
作者： Masato Shingo , Jianbo Liang , Naoteru Shigekawa , Manabu Arai , Kenji Shiojima
关键词:
摘要: … We demonstrated the two-dimensional characterization of p + -Si/n − -SiC heterointerfaces by scanning internal photoemission microscopy (SIPM). In internal photoemission spectra, a …
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