Endurance and retention of mnos devices over the temperature range from −50°c to +125°c

摘要: The effect of temperature variation on the endurance and retention characteristics MNOS devices has been studied over range from −50°c to +125°C. is significantly degraded as increased. Retention, other hand, appears be a more sensitive function cycling than increased temperature. Increased nitride conductivity, thermal excitation tunneling charge centroid movement at higher temperatures along with surface state density caused by are suggested mechanisms explain observed degradation in device performance.