作者: A. Inberg , L. Zhu , G. Hirschberg , A. Gladkikh , N. Croitoru
DOI: 10.1149/1.1415549
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摘要: Scanning tunneling microscopy (STM). high resolution scanning electron microscopy, and transmission (TEM) have been used to study the film evolution at initial stage of deposition structure electrolessly deposited silver films that contain tungsten [Ag(W)] on single crystal silicon (100). We present surface covering process electroless deposition. The reconstruction in this case takes place room temperature. state position was also investigated; TEM measurements indicate NaWO 3 is film. STM images Ag(W) growth show a spiral feature may reveal dominant electrochemical driving force during growth. presence well-resolved steps its nature were demonstrated by fast immersion chronovoltametry. This method applied follow changes energy, which caused pretreatment processes itself.