Scanning force microscope with beam tracking lens
作者： Pan S. Jung , Daphna R. Yaniv
DOI:
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摘要: An atomic force, scanning probe microscope (AFM or SPM) having a stationary-sample stage and cantilever using an optical lever method with S-shape PZT is described. The tip translated to measure surface profiles while simple lens attached the holder guides focused beam from fixed collimated diode laser. This enables change of scanners techniques in air solution without disturbing sample. imaging capability demonstrated up 100×100 square micrometers.
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