Capacitance-voltage profiling and the characterisation of III-V semiconductors using electrolyte barriers
作者： P Blood
DOI: 10.1088/0268-1242/1/1/002
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摘要: … and co-workers to overcome the depth limitation in depletion C-… From this analysis it can be seen that it is difficult to achieve a … The fundamental Debye length limit to the depth resolution …
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sci-hub.se 参考文章(27)
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