作者: Yasuhiro Isobe , Hiromichi Ikki , Tatsuyuki Sakakibara , Motoaki Iwaya , Tetsuya Takeuchi
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摘要: We fabricated and characterized nonpolar a-plane AlGaN/GaN heterostructure field-effect transistors (HFETs) grown on an freestanding GaN substrate. By optimizing the growth conditions, unintentionally doped oxygen concentration was much reduced in buffer layer. As a result, low leakage current layer realized without doping of deep acceptors, such as Fe C, by which impurity-contamination-free channel can be successfully grown. A maximum drain 220 mA/mm at gate source voltage +3.0 V, resistance 10.4 mΩcm2, threshold -1.6 V were realized.